Recent detection of western corn rootworm resistance to Bt (Bacillus thuringiensis) corn prompted recommendations for the use of integrated pest management (IPM) with planting refuges to prolong the durability of Bt technologies. We conducted a simulation experiment exploring the effectiveness of various IPM tools at extending durability of pyramided Bt traits. Results indicate that some IPM practices have greater merits than others. Crop rotation was the most effective strategy, followed by increasing the non-Bt refuge size from 5 to 20%. Soilapplied insecticide use for Bt corn did not increase the durability compared with planting Bt with refuges alone, and both projected lower durabilities. When IPM participation with randomly selected management tools was increased at the time of Bt commercialization, durability of pyramided traits increased as well. When non-corn rootworm expressing corn was incorporated as an IPM option, the durability further increased.

For corn rootworm, a local resistance phenomenon appeared immediately surrounding the resistant field (hotspot) and spread throughout the local neighborhood in six generations in absence of mitigation. Hotspot mitigation with random selection of strategies was ineffective at slowing resistance, unless crop rotation occurred immediately; regional mitigation was superior to random mitigation in the hotspot and reduced observed resistance allele frequencies in the neighborhood. As resistance alleles of mobile pests can escape hotspots, the scope of mitigation should extend beyond resistant sites. In the case of widespread resistance, regional mitigation was less effective at prolonging the life of the pyramid than IPM with Bt deployment at the time of commercialization.